Details
Surface Characterization
A User's Sourcebook1. Aufl.
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205,99 € |
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| Verlag: | Wiley-VCH |
| Format: | |
| Veröffentl.: | 11.07.2008 |
| ISBN/EAN: | 9783527612444 |
| Sprache: | englisch |
| Anzahl Seiten: | 715 |
DRM-geschütztes eBook, Sie benötigen z.B. Adobe Digital Editions und eine Adobe ID zum Lesen.
Beschreibungen
<i>Surface Characterization</i> provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. <p>Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method.</p> <p>Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribological, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included.</p> <p><i>Surface Characterization</i> is addressed to both academic and industrial audiences. Scientists and engineers working on the production and development of new materials will find it an invaluable reference source. Physicist, chemists, chemical engineers, material scientists and engineers from every area of materials research will benefit from the wealth of practical advice the book provides.</p>
PART 1: MICROSTRUCTURE AND TOPOGRAPHY<br> Optical Microscopy<br> Scanning Tunneling and Microscopy<br> Surface Roughness and Microstructure<br> Preparation Technique<br> PART 2: ELEMENTAL COMPOSITION<br> Scanning Electron Microscope<br> X-Ray Fluorescence Techniques<br> Charged Particle Activation Analysis<br> Ion Scattering Spectroscopy<br> Nuclear Reaction Analysis<br> Auger electron Spectroscopy<br> PART 3: CHEMICAL BONDING<br> Surface Characterization with Synchrotron Light<br> Laser Microprobe Mass Spectrometry<br> Fourier Transform Infrared Spectroscopy<br> Mossbauer Spectroscopy<br> Chemometrics<br> PART 4: CRYSTALLOGRAPHY AND STRUCTURE<br> X-Ray Diffraction and Reflectometry<br> Transmission Electron Microscopy<br> Electrons for Surface Diffraction<br> Channeling<br> PART 5: SURFACE FILMS:<br> Optical Characterization of Surfaces by Linear Spectroscopy<br> Optical Second-Harmonic and Sum-Frequency Generation<br> Electrical and Magnetic Properties of Thin Films<br> PART 6: SURFACE PROCESSES/REACTIONS<br> Surface Reactivity<br> Emanation Method<br> Electrochemical Methods<br> Corrosion Measurements<br> Nuclear Based Corrosion Monitoring<br> PART 7: TRIBOSURFACE<br> Tribosurface Properties<br> Wear Measurements Using Thin Layer Activation<br> PART 8: LIFE SCIENCES<br> Biomaterials<br> Nuclear Microscopy
This new book is providing an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of the materials. It can be used as a reference guide for scientists and engineers from a broad range of disciplines within the metallurgy as well as materials technologies.<br> - Aluminium.
<p><b>Dag Brune</b> is the editor of <i>Surface Characterization: A User's Sourcebook</i>, published by Wiley.</p> <p><b>Ragnar Hellborg</b> is the editor of <i>Surface Characterization: A User's Sourcebook</i>, published by Wiley.</p>
<i>Surface Characterization</i> provides an authoritative guide to the wide range of powerful techniques that are used to characterize the surfaces of materials. Practical in approach, it not only describes the major analytical techniques but emphasizes how they can be used to solve a multitude of chemical and physical problems. A special feature of the book is that the various techniques are grouped according to the material property under investigation. These parts are preceded by an overview comparing the capabilities of the characterization methods available. Extensive data tables allow the reader to assess rapidly the strengths as well as the pitfalls inherent in each method. Chapters on chemical composition, optical and crystallographic properties, microtopography, surface processes, tribology, electrical and magnetic properties of surface films are featured. In addition, chapters specializing on applications within the life sciences on the microscopic scale and chemometrics are included.
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